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Interference analysis in X-ray fluorescence spectrometer analysis
1. In the analysis of X-ray fluorescence spectrometer, some or some of the spectral lines may overlap between certain elements. The basic parametric equation requires the use of a net intensity that is unaffected by spectral line overlap. Some empirical corrections are included in these equations.
2. In the analysis of X-ray spectrometers, there may be inter-element interference or matrix effects between certain elements. The empirical way to compensate for these effects is to prepare a series of calibration standards, the concentration range covering the range to be analyzed. A carefully designed reference material is required at this time. That is, the content of all elements that do not need to be analyzed is fixed, and the concentration of elements to be analyzed is different. This is called matrix matching. Of course, mathematical methods can be used in the analysis of X-ray fluorescence spectrometers to compensate for the effects between elements or substrates.
3. Interference may also result from the characteristic lines produced by the targets in the Compton line or X-ray tube, which are removed by the use of filter wheels, but may also result in a decrease in the intensity of the analytical line.
4. In the analysis of X-ray fluorescence spectrometer, the interference may also come from the error of the metallographic structure. The density of the target element is affected by the mass absorption coefficient of the sample, and the mathematical model assumes a homogeneous substance, which brings errors. For example, in steels containing carbon and carbide, titanium and nickel may exist as a nickel-nickel carbide, which has a lower mass absorption coefficient than titanium for the Ka line of titanium, titanium The density is higher than this sample.
5. For the X-ray fluorescence spectrometer due to the analysis of the nature of the solid injection, and the nature of the sample surface may be different from the standard, resulting in analytical bias.
In summary, the greater the difference between the sample and the standard, the greater the error. The so-called difference includes: the physical and chemical properties of the matrix material, such as the density, structure, composition and concentration, surface condition, and even the content of the element to be tested in the sample, whether or not the content of the sample is in the range of the sample. All have an impact on the accuracy of the analysis results.
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